DocumentCode :
644196
Title :
A novel smart card development platform for evaluating physical attacks and PUFs
Author :
Katashita, Toshihiro ; Sasaki, A. ; Hori, Yoichi
Author_Institution :
Res. Inst. of Secure Syst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear :
2013
fDate :
1-4 Oct. 2013
Firstpage :
37
Lastpage :
39
Abstract :
Smart cards are widely used in our life, and they handle sensitive information. The cryptographic modules on smart cards must be updated to support new algorithms and countermeasures against new threats. In this study, we designed a smart card board with an FPGA in order to develop and evaluate embedded circuits for smart cards. A smart card reader board for side-channel attack experimentation was developed in our previous study. By combining these boards and software, we constructed a platform to develop embedded hardware, software, and applications with smart cards for countermeasures against physical attacks and physical unclonable functions. The details of the platform are described in this paper, and side-channel attack experiments demonstrate that a cryptographic key was extracted from electromagnetic radiation on the smart card board, while a countermeasure with regulators and capacitors prevented attacks that exploit power consumption.
Keywords :
cryptography; embedded systems; field programmable gate arrays; smart cards; FPGA; PUF; cryptographic key; cryptographic modules; electromagnetic radiation; embedded applications; embedded circuits; embedded hardware; embedded software; field programmable gate array; physical attacks; physical unclonable functions; power consumption; side-channel attack experimentation; smart card development platform; Cryptography; Field programmable gate arrays; Hardware; Power demand; Smart cards; Software; FPGA; development platform; embedded devices; physical attacks; physical unclonable functions; smart card;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics (GCCE), 2013 IEEE 2nd Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4799-0890-5
Type :
conf
DOI :
10.1109/GCCE.2013.6664860
Filename :
6664860
Link To Document :
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