Title :
Terahertz imaging for nondestructive inspection of materials including conductive microparticles
Author :
Kurabayashi, Toshiyuki ; Yodokawa, Shinichi ; Kosaka, S.
Author_Institution :
Grad. Sch. of Eng. & Resource Sci., Akita Univ., Akita, Japan
Abstract :
THz imaging for nondestructive inspection of the materials including conductive microparticles has been studied by use of FDTD analysis and THz spectroscopy. The allocated conductive particles causes the scattering for THz-wave. Though the scattering factor depends on the frequency, a frequency selected wave would be suitable for nondestructive inspection.
Keywords :
conducting materials; finite difference time-domain analysis; inspection; nondestructive testing; terahertz wave imaging; terahertz wave spectra; FDTD analysis; THz spectroscopy; THz-wave scattering; conductive microparticles; frequency selected wave; nondestructive inspection; terahertz imaging; Carbon; Films; Finite difference methods; Imaging; Scattering; Time-domain analysis;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665650
