Title :
Near-field imaging and nano-Fourier transform infrared spectroscopy by using a broadband synchrotron radiation source
Author :
Hermann, Peter ; Hoehl, A. ; Patoka, P. ; Huth, F. ; Ruhl, E. ; Ulm, G.
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Berlin, Germany
Abstract :
We demonstrate scanning near-field optical microscopy with a spatial resolution below 100 nm by using broadband synchrotron radiation in the infrared range provided by the Metrology Light Source. This approach opens up the possibility to perform Fourier transform infrared spectroscopy on a nanoscale.
Keywords :
Fourier transform spectroscopy; infrared spectroscopy; near-field scanning optical microscopy; synchrotron radiation; Metrology Light Source; broadband synchrotron radiation source; nanoFourier transform infrared spectroscopy; near-field imaging; scanning near-field optical microscopy; spatial resolution; Antennas; Gold; Harmonic analysis; Optical surface waves; Silicon carbide; Surface waves;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665710
