• DocumentCode
    644741
  • Title

    Near-field imaging and nano-Fourier transform infrared spectroscopy by using a broadband synchrotron radiation source

  • Author

    Hermann, Peter ; Hoehl, A. ; Patoka, P. ; Huth, F. ; Ruhl, E. ; Ulm, G.

  • Author_Institution
    Phys.-Tech. Bundesanstalt (PTB), Berlin, Germany
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate scanning near-field optical microscopy with a spatial resolution below 100 nm by using broadband synchrotron radiation in the infrared range provided by the Metrology Light Source. This approach opens up the possibility to perform Fourier transform infrared spectroscopy on a nanoscale.
  • Keywords
    Fourier transform spectroscopy; infrared spectroscopy; near-field scanning optical microscopy; synchrotron radiation; Metrology Light Source; broadband synchrotron radiation source; nanoFourier transform infrared spectroscopy; near-field imaging; scanning near-field optical microscopy; spatial resolution; Antennas; Gold; Harmonic analysis; Optical surface waves; Silicon carbide; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665710
  • Filename
    6665710
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=644741