DocumentCode
644763
Title
Extremely low-jitter and ultra-broadband electrooptic sampling system for near field sensing of active and passive sub-THz electronic devices
Author
Jamshidifar, M. ; Bolivar, P. Haring
Author_Institution
Inst. of High Freq. & Quantum Electron., Univ. of Siegen, Siegen, Germany
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
In this paper we present an ultra-broadband measurement electrooptic sampling (EOS) system for characterization of active mm-wave and sub-THz electronic devices. We also introduce a novel solution for the challenge of relative jitter in EOS of CW exited circuits that extremely recovers the measurement bandwidth of the system.
Keywords
electro-optical devices; jitter; millimetre wave measurement; terahertz wave devices; CW exited circuits; active millimeter wave electronic devices; active subterahertz electronic devices; bandwidth measurement; low-jitter electrooptic sampling system; near field sensing; passive subterahertz electronic devices; ultra-broadband electrooptic sampling system; ultra-broadband measurement EOS system; ultra-broadband measurement electrooptic sampling system; CMOS integrated circuits; Detectors; Harmonic analysis; Performance evaluation; Photodiodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665733
Filename
6665733
Link To Document