DocumentCode
644857
Title
Quarter waveplate at upper terahertz range based on form birefringence
Author
Banghong Zhang ; Yandong Gong ; Notake, Takashi ; Minamide, Hiroaki
Author_Institution
Inst. for Infocomm Res., Singapore, Singapore
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
Quarter waveplates (QWPs) at upper terahertz range are demonstrated based on form birefringence of silicon grating. With depth of 15.5 and 8.4 μm, the gratings act as QWPs at 4.9 and 9.5 THz, respectively. The QWP is also successfully used to measure the state of polarization in a polarimetric system.
Keywords
birefringence; diffraction gratings; elemental semiconductors; light polarisation; microwave photonics; optical retarders; polarimetry; silicon; Si; birefringence; frequency 4.9 THz; frequency 9.5 THz; polarimetric system; polarization state; quarter waveplate; silicon grating; upper terahertz range; Cadmium; Equations; Gratings;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665828
Filename
6665828
Link To Document