• DocumentCode
    646715
  • Title

    Three dimensional polarization controllable electromagnetic cell

  • Author

    Bo Zhu ; Weng Cho Chew ; Lijun Jiang

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2013
  • fDate
    5-9 Aug. 2013
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    We demonstrate an electromagnetic (EM) cell that can generate uniform electric field with three dimensional (3D) polarization dynamic control for the EM compatibility/interference (EMC/EMI) testing. 3D orthogonal slotline structures are designed and utilized to build the walls of the EM cell. By feeding the slotlines in phase and terminating them with matching loads, the uniform electric field similar to a standing wave is produced by two slotline modes propagating in opposite directions inside the cell. Microwave switches are integrated into the slotlines so that we can choose the operating slotline dynamically and change its orientation in a 3D manner by adjusting the ON/OFF state of the appropriate switches. As a result, the polarization of the EM field generated by the operating slotline will be changed orthogonally in 3D. Both simulation and experiment show that a polarization controllable uniform electric field can be achieved in the center region of the EM cell from DC frequency to its first EM resonance frequency, enabling EMC/EMI testing more flexibly without rotating the device under test.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; microwave switches; polarisation; slot lines; 3D orthogonal slotline structures; EM cell; EM compatibility testing; EM interference testing; microwave switches; slotlines; three dimensional polarization controllable electromagnetic cell; three dimensional polarization dynamic control; uniform electric field; Electric fields; Electromagnetic compatibility; Electromagnetic interference; Slot lines; TEM cells; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4799-0408-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2013.6670434
  • Filename
    6670434