DocumentCode :
646762
Title :
System level simulation solutions for high-speed channels - Package and PCB interface
Author :
Jianmin Zhang ; Scogna, A.C. ; Vincent, Tracey ; Hong Shi ; Hui Liu
Author_Institution :
Altera Corp., San Jose, CA, USA
fYear :
2013
fDate :
5-9 Aug. 2013
Firstpage :
593
Lastpage :
598
Abstract :
Package and PCB co-simulation is common in system level companies for the prediction of high-speed channel performance. In recent times, chip companies have been paying closer attention to package and PCB co-simulations in order to guarantee the performances of these chips at the system level. However, full-wave package and PCB co-simulation can be challenging: if the package and PCB are modeled together, the co-simulation is limited by either available computational resource, due to the extremely large memory consumption, or by affordable simulation time. The current, widely adopted method in industry, for PCB and package co-simulation, is to model them separately. There has been little investigation of where to separate/segment the PCB and package and build a reference plane. The reference plane is critical to the simulation results of the entire channel. It is recognized that a TEM wave is required at the reference plane so that the current and voltage are well defined. It can be difficult to tell if a TEM wave is established at the reference plane and if it is not, what is the solution? This paper investigates these details and will give a more general solution for PCB and package co-simulation based on the consideration of accuracy and efficiency.
Keywords :
circuit simulation; integrated circuit packaging; printed circuit design; PCB cosimulation; PCB interface; TEM wave; chip companies; full-wave package; high-speed channel performance; memory consumption; reference plane; system level companies; system level simulation solutions; Backplanes; Computational modeling; Connectors; Couplings; Dielectrics; Metals; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location :
Denver, CO
ISSN :
2158-110X
Print_ISBN :
978-1-4799-0408-2
Type :
conf
DOI :
10.1109/ISEMC.2013.6670481
Filename :
6670481
Link To Document :
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