DocumentCode
646789
Title
Debugging and analysis of a new noise coupling mechanism in computer system
Author
Weifeng Shu ; Xiaoning Ye ; Yinglei Ren
Author_Institution
PPED, Intel Asia-Pacific R&D Ltd., Shanghai, China
fYear
2013
fDate
5-9 Aug. 2013
Firstpage
741
Lastpage
746
Abstract
Modern memory system is running at higher data rates with growing complexity, which makes debugging memory related system failure increasingly challenging. In this paper, we report a new memory failure mechanism due to unexpected crosstalk and resonant effect. An innovative full channel modelling & simulation methodology is proposed, which utilize both the time domain and frequency domain analysis to identify the problem, and then precisely predict the failure pattern, as well as the maximum noise level. The analysis also leads to an effective low cost solution, which is further verified by lab measurement. Design guidance for future products is also discussed.
Keywords
computer debugging; frequency-domain analysis; memory architecture; random-access storage; time-domain analysis; computer system; failure pattern; frequency domain analysis; full channel modelling methodology; full channel simulation methodology; laboratory measurement; maximum noise level; memory failure mechanism; memory related system failure debugging; noise coupling mechanism analysis; noise coupling mechanism debugging; resonant effect; time domain analysis; unexpected crosstalk; Crosstalk; Frequency-domain analysis; Noise; Noise measurement; Routing; Time-domain analysis; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location
Denver, CO
ISSN
2158-110X
Print_ISBN
978-1-4799-0408-2
Type
conf
DOI
10.1109/ISEMC.2013.6670508
Filename
6670508
Link To Document