DocumentCode :
6476
Title :
Research of a novel temperature adaptive gate driver for power metal-oxide semiconductor
Author :
Zhuang Hua-long ; Hua Guo-huan ; Xu Shen ; Sun Wei-feng ; Li Zhi-qun
Author_Institution :
Nat. ASIC Syst. Eng. Res. Center, Southeast Univ., Nanjing, China
Volume :
6
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
404
Lastpage :
416
Abstract :
Driving power metal-oxide semiconductor field-effect transistor at high frequency may induce significant switching losses, which have a great proportion in total power losses. Especially in the case of higher temperature, switching losses increased tangibly. A novel temperature adaptive gate driver with low power consumption in a high-temperature environment is proposed for switched-mode power supply by the temperature compensation technique. It has been realised to decrease the switching losses in wide scope temperature, and cannot sacrifice performance of the electromagnetic interferences, by regulating di/dt and dv/dt of switching curve in high temperature. A 0.25 μm, 40 V bipolar-CMOS-DMOS (BCD) process technology is utilised and experimental circuits and results are then presented. Compared with the conventional gate driver, the turn-on loss and turn-off loss of the temperature adaptive gate driver can be reduced, respectively, by 17% and 22%. At present, it has been used in an AC-DC converter to improve work efficiency.
Keywords :
BIMOS integrated circuits; compensation; driver circuits; power MOSFET; switched mode power supplies; BCD process technology; bipolar-CMOS-DMOS process technology; electromagnetic interferences; novel temperature adaptive gate driver; of switching curve; power losses; power metal-oxide semiconductor field-effect transistor; size 0.25 mum; switched-mode power supply; switching losses; temperature compensation technique; voltage 40 V;
fLanguage :
English
Journal_Title :
Power Electronics, IET
Publisher :
iet
ISSN :
1755-4535
Type :
jour
DOI :
10.1049/iet-pel.2012.0279
Filename :
6545198
Link To Document :
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