DocumentCode
648536
Title
Self-calibration method for capacitor mismatch elimination
Author
Melikyan, Vazgen ; Aleksanyan, Ani ; Stepanyan, Harutyun ; Harutyunyan, Anna ; Durgaryan, Armen
Author_Institution
Synopsys Armenia CJSC, Yerevan, Armenia
fYear
2013
fDate
27-30 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
An on-die capacitor mismatch elimination method, using reference clock and dc current is presented. The proposed method provides opportunity to measure the difference of the two uniform capacitor values, detect the mismatch due to technology process deviations, and bring it to minimum. In this paper a self-calibration (self-regulation) technique for two identical capacitor mismatch elimination is implemented. The described method allows achieving ±1% accuracy in case of ± 5% mismatch between capacitors, caused by the technological process non-ideality.
Keywords
CMOS integrated circuits; calibration; capacitors; dc current; on-die capacitor mismatch elimination method; reference clock; self-calibration method; technological process non-ideality; technology process deviations; uniform capacitor values;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium, 2013 East-West
Conference_Location
Rostov-on-Don
Print_ISBN
978-1-4799-2095-2
Type
conf
DOI
10.1109/EWDTS.2013.6673121
Filename
6673121
Link To Document