• DocumentCode
    648536
  • Title

    Self-calibration method for capacitor mismatch elimination

  • Author

    Melikyan, Vazgen ; Aleksanyan, Ani ; Stepanyan, Harutyun ; Harutyunyan, Anna ; Durgaryan, Armen

  • Author_Institution
    Synopsys Armenia CJSC, Yerevan, Armenia
  • fYear
    2013
  • fDate
    27-30 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An on-die capacitor mismatch elimination method, using reference clock and dc current is presented. The proposed method provides opportunity to measure the difference of the two uniform capacitor values, detect the mismatch due to technology process deviations, and bring it to minimum. In this paper a self-calibration (self-regulation) technique for two identical capacitor mismatch elimination is implemented. The described method allows achieving ±1% accuracy in case of ± 5% mismatch between capacitors, caused by the technological process non-ideality.
  • Keywords
    CMOS integrated circuits; calibration; capacitors; dc current; on-die capacitor mismatch elimination method; reference clock; self-calibration method; technological process non-ideality; technology process deviations; uniform capacitor values;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium, 2013 East-West
  • Conference_Location
    Rostov-on-Don
  • Print_ISBN
    978-1-4799-2095-2
  • Type

    conf

  • DOI
    10.1109/EWDTS.2013.6673121
  • Filename
    6673121