Title :
Properties of code with summation for logical circuit test organization
Author :
Blyudov, Anton ; Efanov, Dmitry ; Sapozhnikov, Vladimir ; Sapozhnikov, Vladimir
Author_Institution :
“Autom. & Remote Control on Railways” Dept., Petersburg State Transp. Univ., St. Petersburg, Russia
Abstract :
In this paper we consider binary codes with summation used at designing test systems of combinational logical circuits. We offer new codes, determine their properties and compare these codes with each other.
Keywords :
binary codes; combinational circuits; integrated circuit design; binary codes; combinational circuits; logical circuit test organization; summation; test systems design;
Conference_Titel :
Design & Test Symposium, 2013 East-West
Conference_Location :
Rostov-on-Don
Print_ISBN :
978-1-4799-2095-2
DOI :
10.1109/EWDTS.2013.6673150
