DocumentCode
648622
Title
A new structure for interconnect offline testing
Author
Sadeghi-Kohan, Somayeh ; Keshavarz, Shahrzad ; Zokaee, Farzaneh ; Farahmandi, Farimah ; Navabi, Zainalabedin
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear
2013
fDate
27-30 Sept. 2013
Firstpage
1
Lastpage
5
Abstract
Multigigahertz range of working frequency, shrinking of technology and loss of signal integrity put circuits´ interconnection at a higher risk of permanent or more frequent transient faults. These faults reduce overall reliability and performance of the circuit. Because of this, testing interconnects becomes an important issue. This paper presents an offline interconnect testing method that improves test time compared to some other earlier methods. The proposed method is implemented by a simple hardware structure, which has low hardware overhead and can detect crosstalk and other types of interconnect faults.
Keywords
integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; circuit interconnection; circuit performance; circuit reliability; crosstalk detection; frequent transient faults; hardware structure; interconnect faults; interconnect offline testing; multigigahertz range; signal integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium, 2013 East-West
Conference_Location
Rostov-on-Don
Print_ISBN
978-1-4799-2095-2
Type
conf
DOI
10.1109/EWDTS.2013.6673207
Filename
6673207
Link To Document