• DocumentCode
    648622
  • Title

    A new structure for interconnect offline testing

  • Author

    Sadeghi-Kohan, Somayeh ; Keshavarz, Shahrzad ; Zokaee, Farzaneh ; Farahmandi, Farimah ; Navabi, Zainalabedin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2013
  • fDate
    27-30 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Multigigahertz range of working frequency, shrinking of technology and loss of signal integrity put circuits´ interconnection at a higher risk of permanent or more frequent transient faults. These faults reduce overall reliability and performance of the circuit. Because of this, testing interconnects becomes an important issue. This paper presents an offline interconnect testing method that improves test time compared to some other earlier methods. The proposed method is implemented by a simple hardware structure, which has low hardware overhead and can detect crosstalk and other types of interconnect faults.
  • Keywords
    integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; circuit interconnection; circuit performance; circuit reliability; crosstalk detection; frequent transient faults; hardware structure; interconnect faults; interconnect offline testing; multigigahertz range; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium, 2013 East-West
  • Conference_Location
    Rostov-on-Don
  • Print_ISBN
    978-1-4799-2095-2
  • Type

    conf

  • DOI
    10.1109/EWDTS.2013.6673207
  • Filename
    6673207