DocumentCode :
648667
Title :
A debugging method for gate level circuit designs by introducing programmability
Author :
Oshima, K. ; Matsumoto, Tad ; Fujita, Masayuki
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
fYear :
2013
fDate :
7-9 Oct. 2013
Firstpage :
78
Lastpage :
83
Abstract :
As the verification and debugging of complicated VLSI designs are dominating the chip development time, automated debugging becomes more and more important. In this paper, we propose a method to correct buggy gate-level designs by introducing programmable circuits, such as look up table (LUT) and multiplexer (MUX), that are inserted in order to formulate the debugging processes mathematically. We first replace sets of gates with programmable circuits and try to find a configuration for correction. Some bugs, however, cannot be fixed with only the replacement. In such cases, we add another input to a LUT, where the selection of such additional input is a key for effective debugging. We introduce a necessary condition by which many unusable signals as input to the LUTs can be efficiently eliminated. The experimental results on industrial designs having real bugs show that our proposed method can automatically correct the designs.
Keywords :
VLSI; integrated circuit design; logic circuits; logic gates; multiplexing equipment; programmable circuits; table lookup; LUT; MUX; VLSI design; buggy gate-level circuit design; debugging method; logic circuit; logic gate; look up table; multiplexer; programmability; programmable circuit; design debugging; gate-level circuit; pro-grammable circuit;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2013 IFIP/IEEE 21st International Conference on
Conference_Location :
Istanbul
Type :
conf
DOI :
10.1109/VLSI-SoC.2013.6673254
Filename :
6673254
Link To Document :
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