DocumentCode
649028
Title
Efficient self-correction scheme for static non-idealities in nano-scale quadrature digital RF transmitters
Author
Chunshu Li ; Min Li ; Ingels, M. ; Xiaoqiang Zhang ; Verhelst, Marian ; Pollin, Sofie ; Van Driessche, Joris ; Bourdoux, Andre ; Van der Perre, Liesbet
Author_Institution
IMEC, Leuven, Belgium
fYear
2013
fDate
16-18 Oct. 2013
Firstpage
71
Lastpage
76
Abstract
As a disruptive solution exploiting the intrinsic speed of deeply scaled CMOS technology, digital RF transmitter has attracted extensive attention for its capability to handle multiple radio standards. However, deeply scaled nano level technology has both pros and cons, so that state-of-the-art designs still suffer from the combination of a large number of non-idealities that are inherent in deeply scaled technology. In this paper, a solution is proposed for the first time to tackle major static non-idealities simultaneously in digital RF transmitter employing an ultra-high-bandwidth digital-to-analog converter. Whereas existing work focuses on only correcting one or few non-idealities in isolated ways. The proposed input-signal segmentation and polynomial transforming scheme makes the proposal a computational efficient solution. Simulation combined with lab measurement results show that, after applying the proposed non-linearity self-correction scheme, on average, the root-mean-square error of a 28-nm digital RF transmitter output can be reduced by over 20 dB.
Keywords
CMOS integrated circuits; digital radio; digital-analogue conversion; linearisation techniques; radio transmitters; deeply scaled CMOS technology; disruptive solution; efficient self-correction scheme; multiple radio standard; nanoscale quadrature digital RF transmitters; nonlinearity self-correction method; root mean square error method; static nonideality; ultrahigh bandwidth digital-analog converter; current-steering DAC; digital transmitter; nano-scale technology; self-correction;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing Systems (SiPS), 2013 IEEE Workshop on
Conference_Location
Taipei City
ISSN
2162-3562
Type
conf
DOI
10.1109/SiPS.2013.6674483
Filename
6674483
Link To Document