• DocumentCode
    649057
  • Title

    FISBLIM: A FIve-Step BLInd Metric for quality assessment of multiply distorted images

  • Author

    Ke Gu ; Guangtao Zhai ; Min Liu ; Xiaokang Yang ; Wenjun Zhang ; Xianghui Sun ; Wanhong Chen ; Ying Zuo

  • Author_Institution
    Inst. of Image Commun. & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2013
  • fDate
    16-18 Oct. 2013
  • Firstpage
    241
  • Lastpage
    246
  • Abstract
    The last decade has seen a surge of interest in the research of image quality assessment (IQA). Many successful quality metrics, such as structural similarity index (SSIM) are reportedly to achieve very high accuracy for various kinds of image distortions. However, in practice, multiple image distortions tend to occur together and this leads difficulty to previous works of IQA including SSIM and variations. This problem is even more difficult for no-reference or blind quality assessment. To answer this challenge, this paper proposes a new FIve-Step BLInd Metric (FISBLIM) for quality assessment of multiply distorted images. The algorithm is built upon several common image processing blocks to simulate the image perceiving process of the human visual system (HVS). The FISBLIM method is not training based and the performance is robust and not database-dependent. Experimental results on the newly released LIVE multiply distorted image quality database demonstrate the effectiveness of FISBLIM as compared with mainstream full-reference and no-reference image quality metrics.
  • Keywords
    blind source separation; image processing; FISBLIM; blind quality assessment; five-step blind metric; human visual system; image processing blocks; image quality assessment; multiple image distortions; multiply distorted images; structural similarity index; Image quality assessment (IQA); JPEG; blind; blur metric; image de-noising; multiply distorted images; noise estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (SiPS), 2013 IEEE Workshop on
  • Conference_Location
    Taipei City
  • ISSN
    2162-3562
  • Type

    conf

  • DOI
    10.1109/SiPS.2013.6674512
  • Filename
    6674512