• DocumentCode
    649200
  • Title

    Testing reversible adder/subtractor for missing control points

  • Author

    Sultana, Shabana ; Radecka, Katarzyna

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
  • fYear
    2013
  • fDate
    4-7 Aug. 2013
  • Firstpage
    412
  • Lastpage
    415
  • Abstract
    Testing reversible circuits is a challenging issue. A commonly used technology related fault model in reversible gate is missing control points of reversible gates. In this paper we address this type of fault in reversible adder/subtractor circuit and present an efficient way to detect and identify the location of the faults. The regular structure of adder/subtractor facilitates the testing of such circuits and we show that only three test vectors are sufficient to test for n-bit adder/subtractor with 100% fault coverage. Moreover, with proper sequence of input test vectors it is possible to find the fault location.
  • Keywords
    adders; circuit testing; fault location; logic gates; logic testing; vectors; fault location identification; input test vector; missing control point; reversible adder-subtractor circuit testing; reversible gate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
  • Conference_Location
    Columbus, OH
  • ISSN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2013.6674673
  • Filename
    6674673