• DocumentCode
    649983
  • Title

    Electrical and optical properties of in-doped ZnO thin films via ultrasonic spray pyrolysis

  • Author

    Biswal, R.R. ; Maldonado, Andres ; de la L Olvera, M.

  • Author_Institution
    Dept. de Ingeniera Electr., CINVESTAV, Mexico City, Mexico
  • fYear
    2013
  • fDate
    Sept. 30 2013-Oct. 4 2013
  • Firstpage
    407
  • Lastpage
    410
  • Abstract
    In-doped ZnO (IZO) thin films have been deposited onto glass substrates by the ultrasonic spray pyrolysis method. The variations of the electrical and optical properties with the indium incorporation were investigated. The optical transmittance through the films was measured in the wavelength range 300-1000 nm with the help of an UV-VIS spectrophotometer. The average optical transmittance of 3 at % indium-doped ZnO thin films was over 80% in the visible range. All the deposited films were polycrystalline in nature. The direct optical band gap value was found to be varying between 3.41 to 3.43 eV. The electrical sheet resistance values were obtained by the four probe method. The variation of substrate temperature as well as the incorporation of indium in the ZnO lattice affects the electrical resistivity.
  • Keywords
    II-VI semiconductors; electric resistance; electrical resistivity; energy gap; indium; optical constants; pyrolysis; semiconductor growth; semiconductor thin films; spray coating techniques; ultraviolet spectra; visible spectra; wide band gap semiconductors; zinc compounds; SiO2; UV-VIS spectrophotometer; ZnO lattice; ZnO:In; average optical transmittance; direct optical band gap; electrical property variation; electrical resistivity; electrical sheet resistance; four probe method; glass substrates; indium incorporation; indium-doped ZnO thin films; optical property variation; substrate temperature variation; ultrasonic spray pyrolysis method; wavelength 300 nm to 1000 nm; tco; ultrasonic spray pyrolysis; zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering, Computing Science and Automatic Control (CCE), 2013 10th International Conference on
  • Conference_Location
    Mexico City
  • Print_ISBN
    978-1-4799-1460-9
  • Type

    conf

  • DOI
    10.1109/ICEEE.2013.6676014
  • Filename
    6676014