Title :
Low frequency noise models analysis and simulation using Forward Bulk Bias
Author :
Vanni Dallasen, Ricardo ; Wirth, Gilson Inacio
Author_Institution :
Dept. of Electr. Eng., Fed. Univ. of Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper discusses flicker noise (1/f) models and design tools used in IC noise analysis. Simulations performed using commercial IC analysis tools indicate that the regular 1/f noise models are unable to produce proper results when Forward Bulk Bias (FBB) technique is applied. An alternative RTS noise model is also analyzed. The simulations performed using this model indicate that it is suitable to analyze circuits using Forward Bulk Bias.
Keywords :
1/f noise; integrated circuit noise; simulation; 1/f models; FBB technique; IC noise analysis; alternative RTS noise model; flicker noise; forward bulk bias; low frequency noise models analysis; simulation;
Conference_Titel :
Microelectronics Technology and Devices (SBMicro), 2013 Symposium on
Conference_Location :
Curitiba
Print_ISBN :
978-1-4799-0516-4
DOI :
10.1109/SBMicro.2013.6676178
