DocumentCode
650146
Title
Low frequency noise models analysis and simulation using Forward Bulk Bias
Author
Vanni Dallasen, Ricardo ; Wirth, Gilson Inacio
Author_Institution
Dept. of Electr. Eng., Fed. Univ. of Rio Grande do Sul, Porto Alegre, Brazil
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
This paper discusses flicker noise (1/f) models and design tools used in IC noise analysis. Simulations performed using commercial IC analysis tools indicate that the regular 1/f noise models are unable to produce proper results when Forward Bulk Bias (FBB) technique is applied. An alternative RTS noise model is also analyzed. The simulations performed using this model indicate that it is suitable to analyze circuits using Forward Bulk Bias.
Keywords
1/f noise; integrated circuit noise; simulation; 1/f models; FBB technique; IC noise analysis; alternative RTS noise model; flicker noise; forward bulk bias; low frequency noise models analysis; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Technology and Devices (SBMicro), 2013 Symposium on
Conference_Location
Curitiba
Print_ISBN
978-1-4799-0516-4
Type
conf
DOI
10.1109/SBMicro.2013.6676178
Filename
6676178
Link To Document