DocumentCode
650359
Title
A novel metric for quantitatively measuring memory effects in OOFDM system
Author
Muyu Huang ; Jun Li ; Hao He ; Meihua Bi ; Shilin Xiao ; Weisheng Hu
Author_Institution
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear
2013
fDate
16-18 May 2013
Firstpage
546
Lastpage
548
Abstract
We propose a novel metric to measure memory effects in optical orthogonal frequency-division multiplexing (OOFDM) system. Experiment results indicate the effectiveness of this method by comparing number of error bits at each subcarriers in different memory-depth predistorted scheme.
Keywords
OFDM modulation; subcarrier multiplexing; OOFDM system; memory-depth predistorted scheme; optical orthogonal frequency-division multiplexing system; quantitatively measuring memory effect; OOFDM; memory effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless and Optical Communication Conference (WOCC), 2013 22nd
Conference_Location
Chongqing
Print_ISBN
978-1-4673-5697-8
Type
conf
DOI
10.1109/WOCC.2013.6676429
Filename
6676429
Link To Document