• DocumentCode
    65251
  • Title

    Study of Transient Ripple in Synchrotron – Practical Applications

  • Author

    Shirakabe, Yoshihisa ; Mori, Yojiro ; Muto, Masayuki ; Sakai, Tadashi ; Yamazaki, Choji ; Yoshino, Tomonobu

  • Author_Institution
    Inst. of Particle & Nucl.Studies, KEK High Energy Accel. Res. Organ., Tsukuba, Japan
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    2588
  • Lastpage
    2594
  • Abstract
    Characteristics of ripples generated as transient responses with idealized current patterns in synchrotrons are studied along with practical applications. The ripples intrinsically occur in synchrotron magnets as a driven harmonic oscillation whenever ramp pattern currents are applied to the magnets. In realistic synchrotron magnet circuits, additionally, damping resistors and interconnection types should be taken into account, because they largely change such circuit parameters as resistance and capacitance. In this paper, effects of damping resistance and conductor types, such as cables and bus-bars, on intrinsic ripples are studied. Simulated results are obtained within realistic circumstances of J-PARC Main-ring Synchrotron in the present 30 GeV operations.
  • Keywords
    accelerator magnets; busbars; cables (electric); capacitance; damping; electric resistance; particle beam diagnostics; resistors; synchrotrons; J-PARC Main-ring Synchrotron; bus-bars; cables; circuit parameters; conductor types; damping resistance; damping resistors; harmonic oscillation; idealized current patterns; interconnection types; intrinsic ripples; ramp pattern currents; synchrotron magnet circuits; synchrotron magnets; transient responses; transient ripples; Capacitance; Damping; Magnetic circuits; Magnetic tunneling; Magnetomechanical effects; Resistors; Synchrotrons; Acceleration; beam loss; capacitance; inductance; magnets; oscillations; proton synchrotrons; ripples;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2347345
  • Filename
    6895320