• DocumentCode
    652667
  • Title

    Application of Statistical Process Control to Software Defect Metrics: An Industry Experience Report

  • Author

    Fernandez-Corrales, Carla ; Jenkins, Michael ; Villegas, Julian

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2013
  • fDate
    10-11 Oct. 2013
  • Firstpage
    323
  • Lastpage
    331
  • Abstract
    Statistical Process Control (SPC) has become of great significance for software engineering organizations as more of them decide to implement quality improvement initiatives. The Capability Maturity Model Integration (CMMI-DEV 1.3) for example, proposes the use of statistical techniques at maturity level 4 to ensure some degree of process predictability. However, the nature of software products and processes poses many challenges to the application of SPC, mainly regarding the design of control charts, a key tool. These challenges have led to opposing views on the applicability of SPC to software processes. This article presents an industry experience report on the application of SPC in a Software Verification and Validation Unit at an Information Technology Division from a financial institution. We present the steps followed to implement SPC in this organization, describe the theoretical assumptions involved in selecting the appropriate control charts, and show a process improvement analysis of using SPC in the organization.
  • Keywords
    program verification; software metrics; statistical process control; SPC; financial institution; information technology division; software defect metrics; software validation; software verification; statistical process control; Control charts; Measurement; Organizations; Process control; Software; Standards organizations; Statistical Process Control; quantitative management; software metrics; software process improvement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Empirical Software Engineering and Measurement, 2013 ACM / IEEE International Symposium on
  • Conference_Location
    Baltimore, MD
  • ISSN
    1938-6451
  • Print_ISBN
    978-0-7695-5056-5
  • Type

    conf

  • DOI
    10.1109/ESEM.2013.51
  • Filename
    6681375