Title :
Embedded digital protection for IPMSM drives
Author :
Saleh, S.A. ; Ahshan, R. ; Rahman, Md Arifur
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada
Abstract :
This paper presents the development, real-time implementation, and experimental testing of a new embedded digital protection for three phase (3φ) interior permanent magnet synchronous motor (IPMSM) drives. The proposed digital protection is established through extracting the high frequency sub-band contents present in the d-q-axis components of the currents drawn by an IPMSM. the desired high frequency sub-band contents are extracted using the wavelet packet transform (WPT). These extracted high frequency sub-band contents contain signature information that allow detecting and classifying transient disturbances occurring in IPMSM drives. Such a structure of the d - q WPT-based digital protection simplifies its implementation, and facilitates its embedding within the controller of an IPMSM drive. Performances of the proposed digital protection are investigated experimentally on a laboratory 5-hp IPMSM drive. Experimental test results for various fault and non-fault transient disturbances demonstrate fast and accurate detection, classification, and responses. Performance features, along with simple implementation of the d - q WPT-based digital protection support its application in IPMSM drives.
Keywords :
digital filters; embedded systems; permanent magnet motors; synchronous motor drives; wavelet transforms; IPMSM drives; embedded digital protection; high frequency subband contents; three phase interior permanent magnet synchronous motor; transient disturbances; wavelet packet transform; Digital filters; Permanent magnet motors; Real-time systems; Synchronization; Synchronous motors; Wavelet transforms; Three phase permanent magnet synchronous motor drives; d - q-axis components; digital filters; real-time implementation; wavelet transforms;
Conference_Titel :
Industry Applications Society Annual Meeting, 2013 IEEE
Conference_Location :
Lake Buena Vista, FL
DOI :
10.1109/IAS.2013.6682494