High-resolution seismic reflection coefficient calculation using a chirp sub-bottom profiler

Author

Sanhaji, Mohammed ; Guarin, Humberto

Author_Institution

Sabrina Porto, EdgeTech, Boca Raton, FL, USA

fYear

2013

fDate

24-26 July 2013

Firstpage

1

Lastpage

3

Abstract

High-resolution seismic data were collected by the Bert Instruments Inc. Company at the South-American Continental Shelf using EdgeTech SB-0512i sub-bottom profiler with frequency band from 500 Hz to 12 kHz. Core samples were taken along with 3 seismic sections in reason to allow detailed analysis of the layers which reflection coefficients were measured. The results were compared to Dr. Edwin L. Hamilton studies.

Keywords

seismology; underwater sound; Bert Instruments Inc. Company; Dr. Edwin L. Hamilton studies; EdgeTech SB-0512i subbottom profiler; South-American Continental Shelf; chirp subbottom profiler; core samples; frequency 500 Hz to 12 kHz; high-resolution seismic data; high-resolution seismic reflection coefficient; seismic sections; Acoustic measurements; Acoustics; Geologic measurements; Geology; Impedance; Reflection coefficient; Sediments; Bert Instruments Inc.; EdgeTech; Sub-bottom Profiler; high-resolution seismic reflection system; reflection coefficient;

fLanguage

English

Publisher

ieee

Conference_Titel

Acoustics in Underwater Geosciences Symposium (RIO Acoustics), 2013 IEEE/OES

Conference_Location

Rio de Janeiro

Type

conf

DOI

10.1109/RIOAcoustics.2013.6684005

Filename

6684005