DocumentCode
65472
Title
A Holistic Self-Calibration Approach for Determination of Three-Dimensional Stage Error
Author
Chuxiong Hu ; Yu Zhu ; Jinchun Hu ; Dengfeng Xu ; Ming Zhang
Author_Institution
Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing, China
Volume
62
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
483
Lastpage
494
Abstract
As previous self-calibration technologies are mostly limited to 1-D or 2-D metrology systems, a holistic and explicit self-calibration strategy is proposed for 3-D precision metrology stages in this paper. With different alignments of a rigid cubic artifact on the uncalibrated 3-D stage, four measurement views are constructed to provide the symmetry, transitivity, and redundancy of the 3-D stage error. The first-order components of the stage error, i.e., the nonorthogonality and the scale difference, are determined through the first three measurement views with mathematical processing. The residual components of the stage error are then determined through a least square-based calculation law. Additionally, the misalignment error and the artifact error are all identified through rigorous algebraic manipulation, which may be useful as foundation for synthesis of other self-calibration algorithms. Computer simulation is carried out, and the results validate that the proposed scheme can achieve good calibration accuracy even under the existence of various random measurement noises. Experimental results are also presented to provide a preliminary illustration and validation of the proposed approach in practical applications.
Keywords
calibration; least squares approximations; measurement errors; measurement systems; random noise; 1D metrology system; 2D metrology system; 3D stage error; algebraic manipulation; artifact error; cubic artifact; least square based calculation; mathematical processing; misalignment error; nonorthogonality; random measurement noise; self-calibration approach; Attenuation measurement; Calibration; Measurement uncertainty; Metrology; Noise; Noise measurement; Position measurement; 3-D stage error; Least square; measurement noise; misalignment error; self-calibration;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2012.2215116
Filename
6343232
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