Total Ionizing Dose Effect on Low On/Off Switching Ratio ${\rm TiO}_{2}$ Memristive Memories

The total ionizing dose effect is experimentally investigated on the electrical characteristics of low on/off switching ratio TiO₂ memristive memories for the first time. The ⁶⁰Co γ-ray irradiation reduces the dispersion of the I-V curves, the resistances and the switch voltages, but the degradations of parameters have no impact on the data storage and reading/writing operations, indicating great stability to the irradiation and potential to the space applications. Furthermore, the low on/off switching ratio devices are ideal samples for the investigations of radiation effect on the memristive devices due to their observable parameter variation post the irradiation exposure.