Performance study of scan-and-wait combining over Nakagami-q (Hoyt) fading channels

Author

Beng Soon Tan ; Ly-Minh-Duy Le ; Kwok Hung Li ; Kah Chan Teh

Author_Institution

Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore

fYear

2013

fDate

13-15 Nov. 2013

Firstpage

1

Lastpage

3

Abstract

The performance of scan-and-wait combining (SWC) over independent non-identically distributed (i.n.d.) slow and flat Nakagami-q (Hoyt) fading channels is examined. The outage probability and average output signal-to-noise ratio (SNR) expressions are derived. Also, the bit-error rate expression for the SWC with different binary modulation schemes over the i.n.d. Hoyt-fading channels is presented. It is shown that the SWC can perform better than the maximal-ratio combining and selection combining with the same number of channel estimates when the predetermined SNR threshold values are optimized. However, the SWC scheme has a drawback of time delay for retransmission of signals.

Keywords

Nakagami channels; diversity reception; error statistics; Hoyt fading channel; Nakagami-q fading channel; average output signal-to-noise ratio; bit error rate; maximal ratio combining; outage probability; scan and wait combining; selection combining; signal retransmission; time delay; Bit error rate; Diversity reception; Fading; Modulation; Receivers; Signal to noise ratio; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Days (WD), 2013 IFIP

Conference_Location

Valencia

ISSN

2156-9711

Type

conf

DOI

10.1109/WD.2013.6686452

Filename

6686452