• DocumentCode
    65547
  • Title

    On Resistive Networks of Constant-Power Devices

  • Author

    Simpson-Porco, John W. ; Dorfler, Florian ; Bullo, Francesco

  • Author_Institution
    Center for Control, Dynamical Syst. & Comput., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • Volume
    62
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    811
  • Lastpage
    815
  • Abstract
    This brief examines the behavior of DC circuits comprised of resistively interconnected constant-power devices (CPDs), as may arise in dc microgrids containing microsources and constant-power loads. We derive a sufficient condition for all operating points of the circuit to lie in a desirable set, where the average nodal voltage level is high, and nodal voltages are tightly clustered near one another. Our condition has the elegant physical interpretation that the ratio of resistive losses to total injected power should be small compared with a measure of network heterogeneity, as quantified by a ratio of conductance matrix eigenvalues. Perhaps surprisingly, the interplay between the circuit topology, branch conductances, and CPDs implicitly defines a nominal voltage level for the circuit, despite the explicit absence of voltage-regulated nodes.
  • Keywords
    eigenvalues and eigenfunctions; electric admittance; matrix algebra; nonlinear network analysis; power supply circuits; CPD; DC circuits; average nodal voltage level; branch conductances; circuit topology; conductance matrix eigenvalues; constant-power loads; dc microgrids; microsources; network heterogeneity; nodal voltages; nominal voltage level; resistive losses; resistively interconnected constant-power devices; total injected power; Circuits and systems; Mathematical model; Microgrids; Ports (Computers); Power system stability; Transmission line matrix methods; Voltage control; Load flow; microgrids; nonlinear circuits; nonlinear network analysis;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2015.2433537
  • Filename
    7108029