DocumentCode
655754
Title
Low-jitter electrooptic sampling of active mm-Wave devices up to 300 GHz
Author
Jamshidifar, M. ; Spickermann, G. ; Eberwein, H. Schafer ; Bolivar, P. Haring
Author_Institution
Inst. of High Freq. & Quantum Electron., Univ. of Siegen, Siegen, Germany
fYear
2013
fDate
6-10 Oct. 2013
Firstpage
752
Lastpage
754
Abstract
In this work we present an electrooptic sampling system for on-wafer characterization of ultrafast active electronic devices. The system capabilities are demonstrated on a prototype 65 nm CMOS nonlinear transmission line circuit. Device operation and sampling up to 300 GHz is achieved by diminishing the relative time jitter between source and sampler.
Keywords
CMOS integrated circuits; electro-optical devices; jitter; millimetre wave devices; transmission lines; CMOS nonlinear transmission line circuit; active mm wave devices; low jitter electrooptic sampling; on wafer characterization; relative time jitter; size 65 nm; ultrafast active electronic devices; Antenna measurements; Bandwidth; Earth Observing System; Electrooptical waveguides; Jitter; Measurement by laser beam; Transmission line measurements; Electrooptic sampling; Nonlinear transmission line; THz; mm-wave;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2013 European
Conference_Location
Nuremberg
Type
conf
Filename
6686765
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