Title :
Real-time EM spectrum and EM interference measurement techniques
Author :
Russer, Peter ; Russer, J. ; Hoffmann, Christian ; Slim, Hassan Hani
Author_Institution :
Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
Abstract :
Time-domain EM spectrum and electromagnetic interference (EMI) measurement systems sample the broad-band EMI signal with GHz sampling rates and compute the EMI spectrum by digital signal processing, e.g. by the fast Fourier transform (FFT). This yields a considerable reduction of the measurement time by up to five orders of magnitude.
Keywords :
electric noise measurement; electromagnetic interference; fast Fourier transforms; EM interference measurement technique; EMI measurement system; FFT; digital signal processing; fast Fourier transform; real time EM spectrum; time domain EM spectrum; Antenna measurements; Detectors; Electromagnetic interference; Frequency measurement; Receivers; Time measurement; Time-domain analysis;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
