New verification routine for pulsed I–V and transient current measurement setup applied to a THz Schottky diode

Author

Khanal, Subash ; Kiuru, Tero ; Mallat, Juha ; Raisanen, Antti V. ; Narhi, T.

Author_Institution

Dept. of Radio Sci. & Eng., MilliLab/Aalto Univ., Espoo, Finland

fYear

2013

fDate

6-10 Oct. 2013

Firstpage

1279

Lastpage

1282

Abstract

In this paper, a verification routine is developed for validating extremely fast pulsed I-V and transient current measurement setups. The measurements performed for the routine include pulsed I-V measurement with different pulse widths (using several voltage and current levels) as well as transient current measurement using different heating and measurement current levels. All the measurements are carried out for several discrete resistors attached on on-wafer test carriers. To demonstrate the usability of the setup, pulsed I-V and transient current measurement results of a THz Schottky diode are presented after the verification routine.

Keywords

Schottky diodes; electric current measurement; terahertz wave devices; THz Schottky diode; current levels; discrete resistors; on-wafer test carriers; pulse widths; pulsed I-V measurement setup; transient current measurement setup; verification routine; voltage levels; Current measurement; Electrical resistance measurement; Pulse measurements; Schottky diodes; Semiconductor device measurement; Transient analysis; Voltage measurement; Pulsed I–V; Schottky diode; thermal impedance; transient current measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (EuMC), 2013 European

Conference_Location

Nuremberg

Type

conf

Filename

6686898