• DocumentCode
    655935
  • Title

    Nonlinear transistor modeling for industrial 0.25-µm AlGaN-GaN HEMTs

  • Author

    Chang, Carole ; Di Giacomo-Brunel, Valeria ; Floriot, D. ; Grunenputt, J. ; Hosch, M. ; Blanck, H.

  • Author_Institution
    United Monolithic Semicond. SAS, Villebon-sur-Yvette, France
  • fYear
    2013
  • fDate
    6-10 Oct. 2013
  • Firstpage
    1471
  • Lastpage
    1474
  • Abstract
    Industrial microwave technologies presents specific modeling issues. Foundries have to provide design kits containing linear and nonlinear models which are multi-purpose, scalable and as accurate as possible. This can become quite challenging for technologies presenting complex nonlinear phenomena, such as GaN-based devices. Good trade-off among accuracy, numerical efficiency and generality can be anyway achieved, as shown in the paper.
  • Keywords
    foundries; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; GaN; complex nonlinear phenomena; foundry; gallium nitride-based devices; industrial HEMT; industrial microwave technology; nonlinear transistor modeling; numerical efficiency; size 0.25 mum; Current measurement; Load modeling; Logic gates; Mathematical model; Numerical models; Temperature measurement; Transistors; GaN-Based Devices; Microwave Amplifier; Nonlinear Transistor Modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2013 European
  • Conference_Location
    Nuremberg
  • Type

    conf

  • Filename
    6686946