• DocumentCode
    65662
  • Title

    A High-Linearity Digital-to-Time Converter Technique: Constant-Slope Charging

  • Author

    Jiayoon Zhiyu Ru ; Palattella, Claudia ; Geraedts, Paul ; Klumperink, Eric ; Nauta, Bram

  • Author_Institution
    Univ. of Twente, Enschede, Netherlands
  • Volume
    50
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1412
  • Lastpage
    1423
  • Abstract
    A digital-to-time converter (DTC) controls time delay by a digital code, which is useful, for example, in a sampling oscilloscope, fractional-N PLL, or time-interleaved ADC. This paper proposes constant-slope charging as a method to realize a DTC with intrinsically better integral non-linearity (INL) compared to the popular variable-slope method. The proposed DTC chip realized in 65 nm CMOS consists of a voltage-controlled variable-delay element (DTC-core) driven by a 10 bit digital-to-analog converter. Measurements with a 55 MHz crystal clock demonstrate a full-scale delay programmable from 19 ps to 189 ps with a resolution from 19 fs to 185 fs. As available oscilloscopes are not good enough to reliably measure such high timing resolution, a frequency-domain method has been developed that modulates a DTC edge and derives INL from spur strength. An INL of 0.17% at 189 ps full-scale delay and 0.34% at 19 ps are measured, representing 8-9 bit effective INL-limited resolution. Output rms jitter is better than 210 fs limited by the test setup, while the DTC consumes 1.8 mW.
  • Keywords
    CMOS digital integrated circuits; digital-analogue conversion; frequency-domain analysis; time-digital conversion; CMOS process; DTC; DTC-core; INL; constant-slope charging; crystal clock; digital code; digital-to-analog converter; fractional-N PLL; frequency 55 MHz; frequency-domain method; high-linearity digital-to-time converter technique; integral nonlinearity; output RMS jitter; power 1.8 mW; sampling oscilloscope; size 65 nm; time 19 fs to 185 fs; time 19 ps to 189 ps; time delay controls; time-interleaved ADC; variable-slope method; voltage-controlled variable-delay element; word length 8 bit to 10 bit; CMOS integrated circuits; Delays; Inverters; Linearity; Phase locked loops; Shape; Voltage control; Constant slope; DTC; INL; PLL; delay; delay measurement; digital-to-time converter; integral nonlinearity; phase-locked loop; variable delay; variable slope;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2414421
  • Filename
    7108057