On high resolution, pulse-profiled mm-wave intermodulation measurements

Author

Martens, J.

Author_Institution

Anritsu Co., Morgan Hill, CA, USA

fYear

2013

fDate

6-8 Oct. 2013

Firstpage

392

Lastpage

395

Abstract

Distortion measurements in mm-wave systems are becoming increasingly important including in situations with pulsed or related signals. Of particular interest are edge-related phenomena including nonlinearities induced by drive overshoot and ringing and those whose behaviors are convolved with longer time constant mechanisms (e.g., thermal). Complications, calibration methods, potential uncertainties, and resolution-offset tradeoffs associated with this measurement class will be discussed in the context of W-band and D-band amplifier measurements emphasizing edge-related IMD behavior.

Keywords

intermodulation distortion; intermodulation measurement; millimetre wave amplifiers; D-band amplifier measurement; W-band amplifier measurements; calibration method; distortion measurement; drive overshoot; edge-related IMD behavior; edge-related phenomena; mm-wave systems; potential uncertainties; pulse-profiled mm-wave intermodulation measurement; pulsed signal; related signal; resolution-offset tradeoff; ringing; time constant mechanism; Calibration; Frequency measurement; Modulation; Pollution measurement; Power measurement; Pulse measurements; Receivers; intermodulation distortion; mm-wave; network analyzer; nonlinearity; pulse profile;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Integrated Circuits Conference (EuMIC), 2013 European

Conference_Location

Nuremberg

Type

conf

Filename

6687868