Title :
Distributed piezoelectric Thin Film Sensor Array for monitoring impact events
Author :
Joshi, S. ; Nayak, Mithun M. ; Rajanna, K.
Author_Institution :
Dept. of Instrum. & Appl. Phys., Indian Inst. of Sci., Bangalore, India
Abstract :
Accurate monitoring of impact events is of paramount importance for structural health monitoring, quality control and failure analysis of numerous structures. The present paper reports on the application aspect of distributed piezoelectric Thin Film Sensor Array (TFSA) for the impact force measurement. The distributed TFSA consists of 3×3 sensing element matrix of piezoelectric ZnO thin film. Highly c-axis oriented piezoelectric ZnO thin film was deposited on the flexible Phynox alloy substrate by RF reactive magnetron sputtering and was characterized by FESEM and AFM techniques. The individual sensing element is a MIM (Metal Insulator Metal) type structure. The ZnO thin film acts as an impact sensing layer and is sandwiched between Phynox common electrode and silver thin film as a top electrode. The overall dimension of the developed TFSA was 3cm × 3cm, and it monitors the location, force-time history and magnitude of the impact force. The developed piezoelectric TFSA has potential applications in monitoring the impact events on several composite structures like wings of an aircraft, crash testing of vehicles and wearable sports impact indicators.
Keywords :
II-VI semiconductors; MIM structures; atomic force microscopy; condition monitoring; distributed sensors; failure analysis; field emission electron microscopy; force measurement; matrix algebra; piezoelectric devices; piezoelectric thin films; quality control; semiconductor thin films; sensor arrays; sputtering; structural engineering; thin film sensors; wide band gap semiconductors; zinc compounds; AFM technique; CoCrNi; FESEM technique; MIM type structure; Phynox common electrode; RF reactive magnetron sputtering; ZnO; composite structure; distributed TFSA; distributed piezoelectric TFSA; failure analysis; flexible Phynox alloy substrate; force time history monitoring; impact event monitoring accuracy; impact force measurement; impact sensing layer; location monitoring; magnitude monitoring; metal insulator metal; piezoelectric ZnO thin film; quality control; sensing element matrix; size 3 cm; structural health monitoring; thin film sensor array; Films; Force; Monitoring; Sensors; Substrates; Zinc oxide; Impact sensing; Piezoelectricity; ZnO thin film;
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
DOI :
10.1109/ICSENS.2013.6688459