Title :
CMOS sensor for sun tracking
Author :
Hongyi Wang ; Tao Luo ; Hongjiang Song ; Christen, Jennifer Blain
Author_Institution :
Dept. of Microelectron., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
We present an optical localization chip capable of detecting the direction of incident light. The chip requires no offchip optical or mechanical components or post-processing (e.g. baffles, slits, mirrors, etc.). The chip was fabricated in a standard 0.5 μm CMOS (complementary metal oxide semiconductor) process. Our approach employs 100 light sensing cells, each having two detectors separated by a metal “wall”. The “wall” was created by stacking all metal layers, contacts and vias available in the process. This metal stack “wall” is used to create on-chip shadowing to facilitate detection. Each optical detection element produces a differential output with the normalized difference between the currents dependent upon the angle of the incident light. The width of the photodiodes is limited by the height of the metal wall to only a few micrometers. To achieve a good sensitivity, 100 cells are placed in parallel. Test results show good sensitivity to the direction and intensity of the incident light with accuracy of 1.9 degrees over a 100 degree range and 1.1 degrees over a 50 degree range.
Keywords :
CMOS image sensors; optical sensors; photodetectors; photodiodes; CMOS sensor; angle of incident light; complementary metal oxide semiconductor; contact; direction of incident light detection; light sensing cell; metal layer stacking; metal stack wall; on-chip shadowing; optical detection element; optical localization chip; photodiode; size 0.5 mum; sun tracking; Metals; Optical device fabrication; Optical sensors; Optical variables measurement; Photodiodes; Semiconductor device measurement; Sun;
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
DOI :
10.1109/ICSENS.2013.6688498