Title :
An event-detection high dynamic range CMOS image sensor
Author :
Koklu, Gozen ; Dechao Sun ; Leblebici, Yusuf ; De Micheli, G. ; Carrara, Sandro
Abstract :
A novel CMOS image sensor is proposed to overcome the analog design limitations in Active Pixel Sensors - APS and large area overcome in Digital Pixel Sensors - DPS for use in bio-medical applications. The design includes a pixel level event generation mechanism by using a binary search technique. A ramp voltage generated by a combined block of 10-bit counter and DAC Digital to Analog Converter is compared with the pixel integrated voltage at each clock cycle at the same time allowing a fixed exposure time interval. The proposed design arrives to a total pixel array area of 1505.62μm × 4566μm for a pixel array size of 160(Zf) × 120(V). The photo-active area in each pixel is considered as the N-well area in a p002B;/n-well/p-sub type photo-transistor corresponding to a size of 11.24μm × 10.76μm. The overall pixel array reaches a fill factor of %34.
Keywords :
CMOS image sensors; biomedical imaging; biomedical transducers; digital-analogue conversion; integrated circuit design; photodetectors; phototransistors; ramp generators; APS; DAC; DPS; N-well area; active pixel sensor; analog design limitation; binary search technique; biomedical application; digital pixel sensor; digital to analog converter; event-detection high dynamic range CMOS image sensor; p+-n-well-p-sub type phototransistor; photoactive area; pixel integrated voltage; pixel level event generation mechanism; ramp voltage generation; word length 10 bit; Arrays; CMOS image sensors; Clocks; Dynamic range; Radiation detectors; Random access memory;
Conference_Titel :
SENSORS, 2013 IEEE
Conference_Location :
Baltimore, MD
DOI :
10.1109/ICSENS.2013.6688546