DocumentCode
658144
Title
Reliable packaging technologies for power electronics: Diffusion soldering and heavy copper wire bonding
Author
Syed Khaja, A. ; Kaestle, C. ; Franke, J.
Author_Institution
Inst. for Factory Autom. & Production Syst., Friedrich-Alexander Univ. of Erlangen-Nuremberg, Nuremberg, Germany
fYear
2013
fDate
29-30 Oct. 2013
Firstpage
1
Lastpage
6
Abstract
Production of a reliable power module capable of achieving higher switching frequencies and higher junction temperatures is limited by the present assembly and packaging methods, mostly in the areas of the die-attach and the top level interconnections. The present study aims to display the advances in packaging technologies of diffusion soldering and heavy copper wire bonding in the view of material characterization, process optimization and quality improvement. In diffusion soldering, the growth of intermetallic phases through thin-layer paste deposition and solder profile optimization with vapor phase soldering were investigated. Solder paste inspections were performed to evaluate the errors during deposition process for thin layers and influences on soldering process and related post-failure modes. In heavy wire copper bonding, the impact of substrates with a mechanically polished surface of reduced roughness was investigated. Furthermore the influence of applying the bond force in a ramp style was examined and inspected with the pull and shear forces. The bond width was also monitored in order to receive a non-destructive quality feature for the process monitoring. All test series were accompanied by a close control of the tool wear-out and its influence on process stability.
Keywords
chemical mechanical polishing; copper alloys; electronics packaging; failure analysis; inspection; interconnections; lead bonding; power electronics; soldering; vapour deposition; assembly; die-attach; diffusion soldering; heavy copper wire bonding; intermetallic phase growth; junction temperatures; material characterization; mechanically polished surface; nondestructive quality feature; post-failure modes; power electronics; process monitoring; process optimization; process stability; quality improvement; ramp style; reliable packaging technology; reliable power module; shear forces; solder paste inspections; solder profile optimization; switching frequency; thin-layer paste deposition; tool wear-out; top level interconnections; vapor phase soldering; Force; Rough surfaces; Soldering; Substrates; Surface roughness; Surface treatment; Wires; copper wire bonding; diffusion soldering; power electronic packaging; process quality; tool wear-out;
fLanguage
English
Publisher
ieee
Conference_Titel
Electric Drives Production Conference (EDPC), 2013 3rd International
Conference_Location
Nuremberg
Print_ISBN
978-1-4799-1102-8
Type
conf
DOI
10.1109/EDPC.2013.6689763
Filename
6689763
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