DocumentCode :
658572
Title :
An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System
Author :
Moreira, J. ; Roth, Bernhard ; Werkmann, Hubert ; Klapproth, Lars ; Howieson, Michael ; Broman, Mark ; Ouedraogo, Wend ; Lin, Man
fYear :
2013
fDate :
18-21 Nov. 2013
Firstpage :
271
Lastpage :
276
Abstract :
This paper presents an active test fixture approach for at-speed functional testing of high-speed I/O interfaces with automated test equipment that is able to reach data rates of 40 Gbps and above. At these data rates signal integrity is critical. Because of this we will not only discuss the solution in terms of its instrumentation but also the challenges of getting the signal to the DUT with the needed parametric performance. We will also show some results with a real application running at 40 Gbps.
Keywords :
automatic test equipment; input-output programs; user interfaces; DUT; I/O interfaces; active test fixture approach; at-speed functional testing; automated test equipment; bit rate 40 Gbit/s; data rate signal integrity; parametric performance; standard ATE system; Calibration; Clocks; Fixtures; Instruments; Sockets; Standards; High-Speed Digital; 40 Gbps;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2013 22nd Asian
Conference_Location :
Jiaosi Township
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2013.57
Filename :
6690653
Link To Document :
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