DocumentCode
660561
Title
Personalized defect prediction
Author
Tian Jiang ; Lin Tan ; Sunghun Kim
Author_Institution
Univ. of Waterloo, Waterloo, ON, Canada
fYear
2013
fDate
11-15 Nov. 2013
Firstpage
279
Lastpage
289
Abstract
Many defect prediction techniques have been proposed. While they often take the author of the code into consideration, none of these techniques build a separate prediction model for each developer. Different developers have different coding styles, commit frequencies, and experience levels, causing different defect patterns. When the defects of different developers are combined, such differences are obscured, hurting prediction performance. This paper proposes personalized defect prediction-building a separate prediction model for each developer to predict software defects. As a proof of concept, we apply our personalized defect prediction to classify defects at the file change level. We evaluate our personalized change classification technique on six large software projects written in C and Java-the Linux kernel, PostgreSQL, Xorg, Eclipse, Lucene and Jackrabbit. Our personalized approach can discover up to 155 more bugs than the traditional change classification (210 versus 55) if developers inspect the top 20% lines of code that are predicted buggy. In addition, our approach improves the F1-score by 0.01-0.06 compared to the traditional change classification.
Keywords
Java; Linux; program compilers; C software projects; Eclipse; Jackrabbit; Linux kernel; Lucene; PostgreSQL; Xorg; coding styles; commit frequencies; different defect patterns; experience levels; java software projects; personalized defect prediction; separate prediction model; software defect prediction; Computer bugs; Feature extraction; Mars; Predictive models; Syntactics; Training; Vectors; Change classification; machine learning; personalized defect prediction; software reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Automated Software Engineering (ASE), 2013 IEEE/ACM 28th International Conference on
Conference_Location
Silicon Valley, CA
Type
conf
DOI
10.1109/ASE.2013.6693087
Filename
6693087
Link To Document