• DocumentCode
    66170
  • Title

    Developing Prognostic Models Using Duality Principles for DC-to-DC Converters

  • Author

    Samie, Mohammad ; Perinpanayagam, Suresh ; Alghassi, Alireza ; Motlagh, Amir M. S. ; Kapetanios, Epaminondas

  • Author_Institution
    Sch. of Appl. Sci., Cranfield Univ., Cranfield, UK
  • Volume
    30
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    2872
  • Lastpage
    2884
  • Abstract
    Within the field of Integrated System Health Management, there is still a lack of technological approaches suitable for the creation of adequate prognostic model for large applications whereby a number of similar or even identical subsystems and components are used. Existing similarity among a number of different systems, which are comprised of similar components but with different topologies, can be employed to assign the prognostics of one system to other systems using an inference engine. In the process of developing prognostics, this approach will thereby save resources and time. This paper presents a radically novel approach for building prognostic models based on system similarity in cases where duality principle in electrical systems is utilized. In this regard, unified damage model is created based on standard Tee/Pi models, prognostics model based on transfer functions, and remaining useful life (RUL) estimator based on how energy relaxation time of system is changed due to degradation. An advantage is that the prognostic model can be generalized such that a new system could be developed on the basis and principles of the prognostic model of other systems. Simple electronic circuits, dc-to-dc converters, are to be used as an experiment to exemplify the potential success of the proposed technique validated with prognostics models from particle filter.
  • Keywords
    DC-DC power convertors; circuit reliability; condition monitoring; duality (mathematics); maintenance engineering; transfer functions; DC-to-DC converters; Pi model; Tee model; duality principles; electrical systems; electronic circuits; energy relaxation time; integrated system health management; particle filter; prognostic models; remaining useful life estimator; system similarity; transfer functions; Degradation; Insulated gate bipolar transistors; Integrated circuit modeling; Mathematical model; RLC circuits; Resistors; Topology; Cuk converter; Degradation; Duality; Inegrated System Health Management (ISHM); degradation; duality; integrated system health management (ISHM); prognostic model;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2014.2376413
  • Filename
    6971152