DocumentCode :
663197
Title :
Ongoing EEG oscillatory dynamics suggesting evolution of mental fatigue in a color-word matching stroop task
Author :
Guofa Shou ; Lei Ding
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Oklahoma, Norman, OK, USA
fYear :
2013
fDate :
6-8 Nov. 2013
Firstpage :
1339
Lastpage :
1342
Abstract :
Mental fatigue would develop when performing a tedious cognitive task for a long time. The present study evaluated the evolution of mental fatigue in a Stroop task using electroencephalography (EEG) with independent component analysis (ICA) method. Specifically, two aspects of mental fatigue, i.e., mental effort and mental engagement, were tracked by the ongoing oscillatory dynamics from frontal independent component (IC) related to cognitive control and posterior ICs related to attention. While behavioral data, i.e., number of errors and response times, indicated complicated patterns along the time, increasing patterns were consistently observed in the theta band activity of the frontal IC and in the alpha band activity of the posterior ICs as the time on task. These patterns are indicative of a gradual impairment of mental effort and mental engagement (or sustained attention), which can be explained by the evolution of mental fatigue. The present results demonstrate that ongoing EEG obtained from ICA is a sensitive and reliable mean to measure mental fatigue.
Keywords :
cognition; electroencephalography; independent component analysis; medical signal processing; neurophysiology; psychology; ICA; alpha band activity; behavioral data; cognitive control; color-word matching Stroop task; electroencephalography; error number; frontal IC; frontal independent component; gradual impairment; independent component analysis method; mental effort; mental engagement; mental fatigue evolution; mental fatigue measurement; ongoing EEG oscillatory dynamics; posterior IC; response times; tedious cognitive task; theta band activity; Educational institutions; Electroencephalography; Fatigue; Independent component analysis; Integrated circuits; Sociology; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
Conference_Location :
San Diego, CA
ISSN :
1948-3546
Type :
conf
DOI :
10.1109/NER.2013.6696189
Filename :
6696189
Link To Document :
بازگشت