• DocumentCode
    663298
  • Title

    Dynamical sequence generation performance testing method and its application

  • Author

    Yongzhen Sun ; Wei Zheng

  • Author_Institution
    Beijing Jiaotong Univ., Beijing, China
  • fYear
    2013
  • fDate
    Aug. 30 2013-Sept. 1 2013
  • Firstpage
    185
  • Lastpage
    190
  • Abstract
    In order to improve the performance of the test efficiency and reduce the test cost,this paper is based on the data driven the thoughts and combined with the current mainstream test automation technology,putting forward a dynamic generation based on sequence control test thoughts of dynamic test automation method.This method considers the design of the testing progress optimization from both of the overall and partial aspects,making the test platform and the measured objects´statement information as a test-controling information and control the execution of performance sequence dynamicly, and generate every generation of peak performance sequence set. That has been applied to wireless block center (RBC) performance test, and has achieved good results of implementation.
  • Keywords
    automatic test pattern generation; automatic test software; genetic algorithms; rail traffic control; CTCS-3-level train operation control system ground; dynamic test automation method; dynamical sequence generation performance testing method; object statement information; peak performance sequence set; performance improvement; performance sequence execution control; sequence control test; test automation technology; test cost reduction; test efficiency; test-controling information; testing progress optimization design; wireless block center performance test; Concurrent computing; Genetic algorithms; Heuristic algorithms; Observers; Optimization; Sociology; Testing; Automated Test; Many Cars Concurrency RBC Switching; Paralleling Genetic Algorithms; Performance Test; Sequence Dynamic Generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Rail Transportation (ICIRT), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5278-9
  • Type

    conf

  • DOI
    10.1109/ICIRT.2013.6696291
  • Filename
    6696291