DocumentCode :
664508
Title :
InP HBT amplifier MMICs operating to 0.67 THz
Author :
Hacker, Jorg ; Urteaga, M. ; Munkyo Seo ; Skalare, Anders ; Lin, Richard
Author_Institution :
Teledyne Sci. Co., Thousand Oaks, CA, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
3
Abstract :
Two indium-phosphide (InP) double-heterojunction bipolar transistor (DHBT) based terahertz monolithic integrated circuit (TMIC) amplifiers are reported with record operating bandwidths up to 694 GHz. The first amplifier uses 3 μm long emitter transistors, has 24 dB gain at 670 GHz, and a saturated output power of -4 dBm at 585 GHz. The second amplifier uses 6 μm long emitter transistors, has 20 dB gain at 655 GHz, and a saturated output power of -0.7 dBm at 585 GHz. Both TMICs use Teledyne´s 130nm InP DHBT transistors in a common base configuration and are matched using inverted CPW transmission lines realized using a three-metal-layer high-density thin-film interconnects system. These results demonstrate the capability of 130nm InP DHBT technology to enable sophisticated TMIC circuits for operation in the terahertz band.
Keywords :
III-V semiconductors; MMIC amplifiers; heterojunction bipolar transistors; indium compounds; integrated circuit interconnections; monolithic integrated circuits; semiconductor thin films; terahertz wave devices; DHBT transistors; HBT amplifier MMIC; InP; TMIC amplifiers; TMIC circuits; double-heterojunction bipolar transistor; emitter transistors; frequency 0.67 THz; frequency 585 GHz; frequency 655 GHz; gain 20 dB; gain 24 dB; inverted CPW transmission lines; saturated output power; size 130 nm; terahertz band; terahertz monolithic integrated circuit amplifier; three-metal-layer high-density thin-film interconnects system; DH-HEMTs; Gain; Gain measurement; Indium phosphide; Power amplifiers; Power generation; Transmission line measurements; Submillimeter-wave; TMIC; indium phosphide (InP) DHBT bipolar transistor; terahertz;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697518
Filename :
6697518
Link To Document :
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