• DocumentCode
    664663
  • Title

    Low noise amplifiers for 140 GHz wide-band cryogenic receivers

  • Author

    Larkoski, Patricia V. ; Kangaslahti, Pekka ; Samoska, Lorene ; Lai, Richard ; Sarkozy, Stephen ; Church, Sarah E.

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report S-parameter and noise measurements for three different InP 35 nm gate-length High Electron Mobility Transistor (HEMT) Low Noise Amplifier (LNA) designs operating in the frequency range centered on 140 GHz. When packaged in a WR-6.1 waveguide housing, the LNAs have an average measured noise figure of 3.0 dB-3.6 dB over the 122-170 GHz band. One LNA was cooled to 20 K and a record low noise temperature of 46 K, or 0.64 dB noise figure, was measured at 152 GHz. These amplifiers can be used to develop receivers for instruments that operate in the 130-170 GHz atmospheric window, which is an important frequency band for ground-based astronomy and millimeter-wave imaging applications.
  • Keywords
    III-V semiconductors; MMIC amplifiers; S-parameters; astronomy; high electron mobility transistors; indium compounds; integrated circuit design; low noise amplifiers; millimetre wave imaging; noise measurement; radio receivers; HEMT; InP; S parameter measurements; atmospheric window; bandwidth 122 GHz to 170 GHz; frequency 140 GHz; frequency 152 GHz; frequency band; ground based astronomy; high electron mobility transistor; low noise amplifiers; millimeter wave imaging applications; noise figure 0.64 dB; noise figure 3 dB to 3.6 dB; noise measurements; size 35 nm; temperature 20 K; waveguide housing; wideband cryogenic receivers; Cryogenics; Frequency measurement; HEMTs; Noise; Noise measurement; Scattering parameters; Astronomy; Cryogenic electronics; HEMTs; Low-noise amplifiers; MMICs; Noise measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697674
  • Filename
    6697674