DocumentCode :
664708
Title :
On/Off micro-electromechanical switching of AlN piezoelectric resonators
Author :
Nordquist, Christopher D. ; Olsson, Roy H. ; Scott, Stephanie Morgan ; Branch, Darren W. ; Pluym, T. ; Yarberry, Victor
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
We report the first switchable piezoelectric resonator as a building block for a new class of adaptive and reconfigurable filters. The resonator integrates AlN contour-mode resonator and RF MEMS capacitive switch technologies to change the coupling between the RF signal electrodes and the AlN piezoelectric film. Modeling reveals that a 1.5 μm gap minimizes coupling, while a 10 nm gap couples nearly as efficiently as an electrode in intimate contact, suggesting that high contrast can be achieved using this approach. Measurements of a 400 μm × 150 μm two-port resonator demonstrate a switching ratio of 13 dB, a Q of 170, and a center frequency of 240 MHz. Research is continuing with goals of improving the device Q and switching ratio, extending the device operation to other frequencies, and extending the approach to adaptive and reconfigurable filters.
Keywords :
III-V semiconductors; Q-factor; adaptive filters; aluminium compounds; crystal resonators; micromechanical resonators; microswitches; switched capacitor filters; wide band gap semiconductors; AlN; AlN contour-mode resonator; AlN piezoelectric resonators; RF MEMS capacitive switch technologies; RF signal electrodes; adaptive filters; device Q ratio; on-off microelectromechanical switching; reconfigurable filters; switchable piezoelectric resonator; switching ratio; two-port resonator; Bridge circuits; Couplings; III-V semiconductor materials; Micromechanical devices; Optical resonators; Optical switches; Piezoelectric transducers; acoustic devices; radiofrequency microelectromechanical systems; resonator filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697719
Filename :
6697719
Link To Document :
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