Title :
Toward a reliability analysis method of wide band gap power electronic components and modules
Author :
Parent, Guillaume ; Massiot, Gregor ; Rouet, Vincent ; Munier, C. ; Vidal, P.-E. ; Carrillo, Francisco
Author_Institution :
EADS Innovation Works, Suresnes, France
Abstract :
This study is addressing on the reliability of COTS (Commercial Off-The-Shelf) power electronic components and modules which could be used in high reliability systems such as aerospace systems. This paper details the first followed steps to achieve a reliability assessment of some COTS power devices. These first steps are: Construction analyses for the determination of the packaging assembly technologies of COTS power devices; Discussion on the material used in COTS power devices; Synthesis of the potential failure risk analysis under harsh environments; Determination of several accelerated ageing tests to check the potential failure modes and mechanisms in power electronic for aerospace systems.
Keywords :
ageing; assembling; avionics; failure analysis; life testing; modules; power electronics; reliability; risk analysis; COTS power devices; accelerated ageing tests; aerospace systems; commercial off-the-shelf; packaging assembly technology; potential failure risk analysis; power electronic modules; reliability analysis method; reliability assessment; wide band gap power electronic components; Absorption; Materials; Metallization; Silicon carbide; Tin; Wires; COTS; Reliability; assembly technology; construction analyses; power electronic components and modules;
Conference_Titel :
Microelectronics Packaging Conference (EMPC) , 2013 European
Conference_Location :
Grenoble