• DocumentCode
    667644
  • Title

    Self-formation processes in high-speed integrated circuits

  • Author

    Navickas, R.

  • Author_Institution
    Dept. of Comput. Eng., Vilnius Gediminas Tech. Univ., Vilnius, Lithuania
  • fYear
    2013
  • fDate
    11-12 Nov. 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents the analysis of self-formation processes of micro and nanostructures in technologies of manufacturing high-speed semiconductor devices and integrated circuits (ICs) according possibilities to receive the minimal width of the base area and the methods used for the formation of contacts and electrodes. The results of the implementation of self-formation processes for creating new technologies of manufacturing semiconductor devices and ICs have been presented.
  • Keywords
    electrical contacts; forming processes; high-speed integrated circuits; integrated circuit manufacture; semiconductor device manufacture; IC; contacts; electrodes; high-speed integrated circuit; high-speed semiconductor device manufacturing; integrated circui manufacturing; microstructure; nanostructure; self-formation process; Electrodes; Etching; Geometry; Lithography; Microstructure; Oxidation; Transistors; Self-formation processes; integrated circuits (ICs); non-lithography methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    NORCHIP, 2013
  • Conference_Location
    Vilnius
  • Type

    conf

  • DOI
    10.1109/NORCHIP.2013.6701997
  • Filename
    6701997