• DocumentCode
    66778
  • Title

    3D Integrated Optical E-Field Sensor for Lightning Electromagnetic Impulse Measurement

  • Author

    Jiahong Zhang ; Fushen Chen ; Bao Sun ; Kaixin Chen ; Chengxin Li

  • Author_Institution
    Sch. of Commun. & Inf. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    26
  • Issue
    23
  • fYear
    2014
  • fDate
    Dec.1, 1 2014
  • Firstpage
    2353
  • Lastpage
    2356
  • Abstract
    A 3D lithium niobate integrated electro-optical electric field (E-field) sensor utilizing three optical waveguide Mach-Zehnder interferometers has been designed, fabricated, and characterized for the measurement of lightning electromagnetic impulse (EMP). The linear detected E-fields with the sensor are 15-370 kV/m. Experimental results demonstrate that the half wave E-fields of the 3D probe are all more than 4000 kV/m which means the maximal detectable E-field can be exceed 1000 kV/m. Based on the time domain response for applying the nanosecond EMP, the frequency response of the sensor has been calculated up to 500 MHz.
  • Keywords
    Mach-Zehnder interferometers; electro-optical devices; integrated optics; lighting; lithium compounds; niobium compounds; optical design techniques; optical fabrication; optical sensors; optical testing; optical waveguides; 3D lithium niobate integrated electro-optical electric field sensor; LiNbO3; frequency response calculation; lightning electromagnetic impulse measurement; optical waveguide Mach-Zehnder interferometer characterization; optical waveguide Mach-Zehnder interferometer design; optical waveguide Mach-Zehnder interferometer fabrication; time domain response; Electric fields; Frequency response; Optical device fabrication; Optical interferometry; Optical sensors; Optical waveguides; Lithium niobate; lightning electromagnetic pulse (LEMP); optical waveguide Mach-Zehnder interferometer (MZI); three dimension (3D) electric field sensor;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2014.2355209
  • Filename
    6897945