DocumentCode
668909
Title
Timing analysis for thermally robust clock distribution network design for 3D ICs
Author
Sung Joo Park ; Natu, Nitish ; Swaminathan, Madhavan ; Byunghyun Lee ; Sang Min Lee ; Woong Hwan Ryu ; Kee Sup Kim
Author_Institution
Interconnect & Packaging Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2013
fDate
27-30 Oct. 2013
Firstpage
69
Lastpage
70
Abstract
Three-dimensional Integrated Circuits provide a solution to overcome bottlenecks in performance and power management issues. However, the drawback arises in the form of increased thermal density that results in thermal gradients that affect signal integrity. Since, the clock signal is critical for ensuring the performance of synchronous digital systems, its design is very important. In this paper we analyze the effect of thermal gradient on the clock distribution networks in the context of 3D ICs. We also propose novel methods for compensating the thermal effects which have been validated through extensive simulations and preliminary hardware measurements.
Keywords
clock distribution networks; three-dimensional integrated circuits; timing circuits; 3D IC; distribution network; power management; signal integrity; synchronous digital systems; thermal density; thermal effects; thermal gradients; three-dimensional integrated circuits; timing analysis; Clocks; Delays; Integrated circuit modeling; Temperature measurement; Temperature sensors; Three-dimensional displays; Through-silicon vias; 3D IC; CDN (Clock Distribution Network); Propagation Delay; TSV (Throung Silicon Via); Temperature gradient;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2013 IEEE 22nd Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-4799-0705-2
Type
conf
DOI
10.1109/EPEPS.2013.6703469
Filename
6703469
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