Improved noise parameters measurement for high frequency devices

In this paper, we present the conventional noise parameters measurement methods that use a complicate and expensive set-up. They use a noise receiver, an impedance tuner, a calibrated noise source and a vector network analyzer. All this is controlled by heavy software. We show a more synthetic representation of the noise leading to a new measurement process where no impedance tuner is used. At the end, we detail how a transistor (an HBT) can be simply characterized by simple correlation matrices transformation. Then, we give some perspectives toward a method using only a modern vector network analyzer without receiver, noise source nor tuner.